Failure Analysis users have certain needs in a test socket. They need more than electrical connectivity, and typically need optical access to look through to the package. An F/A test socket typically has an open top lid and often an open bottom feature to allow backside access. Often decapsulated devices are thinned, so an FA socket needs to cope by having interchangeable or adjustable lids. Failed devices are often reballed or unballed, so an FA socket must cope with varying devices or allow for connection past a missing BGA ball or bent pin. Holding a sample stable and level is important in microscopy, and our sockets are machined with precise tolerance to secure the device where you want it. Our test sockets are made to order with a wide range of options, materials, and designs to fulfill your failure analysis needs.
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